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Bierman pp. 899-902 Abstract Full Text: [ Read Online (HTML) PDF (87 kB) ] Order | | | Integrated high-inductance three-dimensional toroidal inductors Lin Yu, Dae-Hee Weon, Jeong-Il Kim, and Saeed Mohammadi pp. 903-907 Abstract Full Text: [ Read Online (HTML) PDF (300 kB) ] Order | | | InAlN/GaN heterostructure field-effect transistors on Fe-doped semi-insulating GaN substrates M. Wu, J. H. Leach, X. Ni, X. Li, J. Xie, S. Doğan, Ü. Özgür, H. Morkoç, T. Paskova, E. Preble, K. R. Evans, and Chang-Zhi Lu pp. 908-911 Abstract Full Text: [ Read Online (HTML) PDF (520 kB) ] Order | | | TiN thin film resistors for monolithic microwave integrated circuits Anna Malmros, Mattias Südow, Kristoffer Andersson, and Niklas Rorsman pp. 912-915 Abstract Full Text: [ Read Online (HTML) PDF (137 kB) ] Order | | | Planarization of high aspect ratio p-i-n diode pillar arrays for blanket electrical contacts L. F. Voss, Q. Shao, C. E. Reinhardt, R. T. Graff, A. M. Conway, R. J. Nikolić, Nirmalendu Deo, and Chin Li Cheung pp. 916-920 Abstract Full Text: [ Read Online (HTML) PDF (340 kB) ] Order | | | Micro- and nanopatterned polymethylmethacrylate layers on plastic poly(ethylene terephthalate) substrates by modified roller-reversal imprint process Chiao-Yang Cheng, Franklin Chau-Nan Hong, and Chun-Yuan Huang pp. 921-925 Abstract Full Text: [ Read Online (HTML) PDF (387 kB) ] Order | | | Reducing damage to Si substrates during gate etching processes by synchronous plasma pulsing Camille Petit-Etienne, Maxime Darnon, Laurent Vallier, Erwine Pargon, Gilles Cunge, François Boulard, Olivier Joubert, Samer Banna, and Thorsten Lill pp. 926-934 Abstract Full Text: [ Read Online (HTML) PDF (358 kB) ] Order | | | High-resolution transmission-electron microscope characterization of onionlike carbon transformed from nanodiamond Q. Zou, M. Z. Wang, Y. G. Li, and B. Lu pp. 935-939 Abstract Full Text: [ Read Online (HTML) PDF (844 kB) ] Order | | | Direct-write electron beam lithography in silicon dioxide at low energy Arnaud Beaumont, Christian Dubuc, Jacques Beauvais, and Dominique Drouin pp. 940-945 Abstract Full Text: [ Read Online (HTML) PDF (520 kB) ] Order | | | Modeling of precursor coverage in ion-beam induced etching and verification with experiments using XeF2 on SiO2 Christoph Ebm, Gerhard Hobler, Simon Waid, and Heinz D. Wanzenboeck pp. 946-951 Abstract Full Text: [ Read Online (HTML) PDF (415 kB) ] Order | | | Mechanistic study of ultralow k-compatible carbon dioxide in situ photoresist ashing processes. I. Process performance and influence on ULK material modification Ming-Shu Kuo, A. R. Pal, G. S. Oehrlein, P. Lazzeri, and M. Anderle pp. 952-960 Abstract Full Text: [ Read Online (HTML) PDF (370 kB) ] Order | | | Mechanistic study of ultralow k-compatible carbon dioxide in situ photoresist ashing processes. II. Interaction with preceding fluorocarbon plasma ultralow k etching processes Ming-Shu Kuo, A. R. Pal, G. S. Oehrlein, and Xuefeng Hua pp. 961-967 Abstract Full Text: [ Read Online (HTML) PDF (390 kB) ] Order | | | Degradation behavior of release layers for nanoimprint lithography formed on atomically flat Si(111) terraces Kosuke Kuwabara, Akihiro Miyauchi, and Hiroyuki Sugimura pp. 968-972 Abstract Full Text: [ Read Online (HTML) PDF (639 kB) ] Order | | | Line-width dependency on electromigration performance for long and short copper interconnects Yi-Lung Cheng, We-Yuan Chang, and Ying-Lang Wang pp. 973-977 Abstract Full Text: [ Read Online (HTML) PDF (407 kB) ] Order | | | Silicon on insulator nanoscale backside interconnects for atomic and molecular scale circuits Ma Han Thu Lwin, Thet Naing Tun, Hui Hui Kim, R. S. Kajen, N. Chandrasekhar, and C. Joachim pp. 978-984 Abstract Full Text: [ Read Online (HTML) PDF (1594 kB) ] Order | | | Wafer-scale epitaxial graphene growth on the Si-face of hexagonal SiC (0001) for high frequency transistors Christos Dimitrakopoulos, Yu-Ming Lin, Alfred Grill, Damon B. Farmer, Marcus Freitag, Yanning Sun, Shu-Jen Han, Zhihong Chen, Keith A. Jenkins, Yu Zhu, Zihong Liu, Timothy J. McArdle, John A. Ott, Robert Wisnieff, and Phaedon Avouris pp. 985-992 Abstract Full Text: [ Read Online (HTML) PDF (652 kB) ] Order | | | Photoresist modifications by plasma vacuum ultraviolet radiation: The role of polymer structure and plasma chemistry F. Weilnboeck, R. L. Bruce, S. Engelmann, G. S. Oehrlein, D. Nest, T.-Y. Chung, D. Graves, M. Li, D. Wang, C. Andes, and E. A. Hudson pp. 993-1004 Abstract Full Text: [ Read Online (HTML) PDF (1146 kB) ] Order | | | Device characteristics of HfON charge-trap layer nonvolatile memory Tackhwi Lee and Sanjay K. 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Polyakov, A. V. Markov, M. V. Mezhennyi, A. A. Donskov, S. S. Malakhov, A. V. Govorkov, Yu. P. Kozlova, V. F. Pavlov, N. B. Smirnov, T. G. Yugova, I.-H. Lee, J. Han, Q. Sun, and S. J. Pearton pp. 1039-1043 Abstract Full Text: [ Read Online (HTML) PDF (247 kB) ] Order | | | Reverse gate bias-induced degradation of AlGaN/GaN high electron mobility transistors Chih-Yang Chang, Travis Anderson, Jennifer Hite, Liu Lu, Chien-Fong Lo, Byung-Hwan Chu, D. J. Cheney, E. A. Douglas, B. P. Gila, F. Ren, G. D. Via, Patrick Whiting, R. Holzworth, K. S. Jones, Soohwan Jang et al. pp. 1044-1047 Abstract Full Text: [ Read Online (HTML) PDF (525 kB) ] Order | | | Spatial coherence in electron-beam patterning Ginusha M. Perera, Gila E. Stein, and J. Alexander Liddle pp. 1048-1055 Abstract Full Text: [ Read Online (HTML) PDF (421 kB) ] Order | | | Effects of nanoscale Ni, Al, and Ni–Al interlayers on nucleation and growth of diamond on Si Y. S. Li, Y. Tang, Q. Yang, and A. Hirose pp. 1056-1059 Abstract Full Text: [ Read Online (HTML) PDF (422 kB) ] Order | | | Electron emission from silicon tip arrays controlled by np junction minority carrier injection Robert M. Young, Harvey C. Nathanson, Robert S. Howell, Eric J. Stewart, Bettina A. Nechay, Timothy T. Braggins, Eric M. Graves, Stephen D. Van Campen, R. Christopher Clarke, Scott B. Miserendino, and Jonathan Hawk pp. 1060-1065 Abstract Full Text: [ Read Online (HTML) PDF (353 kB) ] Order | Brief Reports and Comments | | Investigation of the behavior of serum and plasma in a microfluidics system J. Caroline Henderson, Michele Yacopucci, ChangJu Chun, Keith Lenghaus, Frank Sommerhage, and James J. Hickman pp. 1066-1069 Abstract Full Text: [ Read Online (HTML) PDF (102 kB) ] Order | | | Comparative study on the nonperiodic and periodic gratings for scanning probe microscopy drift measurements Dun Niu, Jiawen Li, Yuhang Chen, and Wenhao Huang pp. 1070-1072 Abstract Full Text: [ Read Online (HTML) PDF (392 kB) ] Order | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | |