| 1. | Editorial Board Control Engineering Practice, Volume 18, Issue 5, May 2010, Page IFC | | | 10. | Copper trace fatigue models for mechanical cycling, vibration and shock/drop of high-density PWAs Microelectronics Reliability, In Press, Corrected Proof, Available online 27 April 2010 D. Farley, Y. Zhou, F. Askari, M. Al-Bassyiouni, A. Dasgupta, J.F.J. Caers, J.W.C. DeVries | | | 15. | Electrical transport properties in electroless-etched Si nanowire field-effect transistors Microelectronic Engineering, In Press, Accepted Manuscript, Available online 24 April 2010 Kyeong-Ju Moon, Ji-Hyuk Choi, Tae-Il Lee, Moon-Ho Ham, Wan-Joo Maeng, Inchan Hwang, Hyungjun Kim, Jae-Min Myoung | | |