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viernes, 30 de abril de 2010

ScienceDirect Alert: Solid-State Electronics, Vol. 54, Iss. 7, 2010


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New Volume/Issue is now available on ScienceDirect
Solid-State ElectronicsSolid-State Electronics

Volume 54, Issue 7,  Pages 675-740 (July 2010)


 1. Editorial Board
Page IFC


 
  Regular Papers
 2. Effects of fluorine incorporation on the properties of Ge p-MOS capacitors with HfTiON dielectric
Pages 675-679
C.X. Li, C.H. Leung, P.T. Lai, J.P. Xu

 
 3. On the piezoelectric coupling constant of epitaxial Mg-doped GaN
Pages 680-684
X. Xu, R.C. Woods

 
 4. High voltage REBULF LDMOS with N+ buried layer
Pages 685-688
Baoxing Duan, Yintang Yang, Bo Zhang

 
 5. Extracting the Schottky barrier height from axial contacts to semiconductor nanowires
Pages 689-695
K. Sarpatwari, N.S. Dellas, O.O. Awadelkarim, S.E. Mohney

 
 6. Large-signal model for AlGaN/GaN HEMTs suitable for RF switching-mode power amplifiers design
Pages 696-700
Anwar Jarndal, Pouya Aflaki, Louay Degachi, Ahmed Birafane, Ammar Kouki, Renato Negra, Fadhel M. Ghannouchi

 
 7. Ni–Au contacts to p-type GaN – Structure and properties
Pages 701-709
Julita Smalc-Koziorowska, Szymon Grzanka, Elżbieta Litwin-Staszewska, Ryszard Piotrzkowski, Grzegorz Nowak, Michał Leszczynski, Piotr Perlin, Ewa Talik, Jan Kozubowski, Stanisław Krukowski

 
 8. Effects of thermal annealing on structure, morphology and electrical properties of F16CuPc/α6T heterojunction thin films
Pages 710-714
Rongbin Ye, Mamoru Baba, Koji Ohta, Kazunori Suzuki

 
 9. Interface and electrical properties of La-silicate for direct contact of high-k with silicon
Pages 715-719
K. Kakushima, K. Tachi, M. Adachi, K. Okamoto, S. Sato, J. Song, T. Kawanago, P. Ahmet, K. Tsutsui, N. Sugii, T. Hattori, H. Iwai

 
 10. Characterization of flatband voltage roll-off and roll-up behavior in La2O3/silicate gate dielectric
Pages 720-723
K. Kakushima, T. Koyanagi, K. Tachi, J. Song, P. Ahmet, K. Tsutsui, N. Sugii, T. Hattori, H. Iwai

 
 11. Formation of 30-V power DMOSFET’s by implementing p-counter-doped region within n-type drift layer
Pages 724-727
Miin-Horng Juang, C.C. Hwang, D.C. Shye, J.L. Wang, S.L. Jang

 
 12. The direct evidence of substrate potential propagation in a gate-grounded NMOS
Pages 728-731
Dao-Hong Yang, Jone F. Chen, Kuo-Ming Wu, J.R. Shih, Jian-Hsing Lee

 
 13. Low-resistivity Ni/Pt Ohmic contacts to p-type N-doped ZnO
Pages 732-735
Y.F. Lu, Z.Z. Ye, Y.J. Zeng, L.P. Zhu, J.Y. Huang, B.H. Zhao

 
  Short Communication
 14. Ambient temperature characteristics of Schottky contacts on 4H–SiC aged in air at 350 °C
Pages 736-740
Adetayo V. Adedeji, Ayayi C. Ahyi, John R. Williams, Suzanne E. Mohney, James D. Schofield

 


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