| 2. | Effects of tail states on the conduction mechanisms in silicon carbide thin films with high carbon content Original Research Article Pages 1-8 Kıvanç Sel, Barış Akaoğlu, İsmail Atilgan, Bayram Katircioğlu
Research highlights► a-SiCx:H films were grown by RF PECVD to be the samples with different DOS. ► Apparent activation energies lower than expected were obtained by Arrhenius plot. ► Localized tail states were numerically determined without any asymptotic approach. ► Nearest neighbor hopping conduction at tail states were numerically simulated. ► Fitting to measured conductivities increased activation energies with C content. | | | 3. | Efficiency droop behavior of GaN-based light emitting diodes under reverse-current and high-temperature stress Original Research Article Pages 9-13 Xianjie Shao, Dawei Yan, Hai Lu, Dunjun Chen, Rong Zhang, Youdou Zheng
Research highlights► Efficiency droop of GaN LEDs was studied under reverse-current and high-temperature stress. ► Reverse-current stress could cause an up-shift of peak-efficiency-current of the LEDs. ► High-temperature stress has no impact on the efficiency roll-off point. ► The observations can be explained by a rate-equation model. | | | 4. | Time-dependent thermal crosstalk in multifinger AlGaN/GaN HEMTs and implications on their electrical performance Original Research Article Pages 14-18 Athikom Manoi, James W. Pomeroy, Richard Lossy, Reza Pazirandeh, Joachim Würfl, Michael J. Uren, Trevor Martin, Martin Kuball
Research highlights► Transient thermal crosstalk measured in pulse-operated multifinger AlGaN/GaN HEMTs. ► Inter-finger heat diffusion was found to be negligible within the first 500 ns of electrical pulses. ► At 3 μs after turn-on, thermal crosstalk significantly affects devices with gate pitch <40 μm. ► Gate pitch should be optimised to minimize transient thermal cross-talk. | | | 5. | Microwave absorption properties of gold nanoparticle doped polymers Original Research Article Pages 19-22 C. Jiang, L. Ouattara, C. Ingrosso, M.L. Curri, V. Krozer, A. Boisen, M.H. Jakobsen, T.K. Johansen
Research highlights► Gold nanoparticles doped polymer shows the ability of absorbing microwave energy. ► On-wafer measurement method is capable of characterizing small amount of samples. ► Higher density of gold nanoparticles results in higher energy absorption rate. ► The absorption mechanism is explained by microwave theories. | | | 8. | Efficient fluorescent white organic light-emitting devices based on a ultrathin 5,6,11,12-tetraphenylnaphthacene layer Original Research Article Pages 35-38 Qin Xue, Shiming Zhang, Guohua Xie, Zhensong Zhang, Li Zhao, Yang Luo, Ping Chen, Yi Zhao, Shiyong Liu
Research highlights► We for the first time combine ultrathin layer rubrene with the DSA-ph doped MADN layer in the device to obtain white light. ► We obtained all-fluorescent WOLED, which has comparatively high EL efficiency. ► We did deep research into the light-emitting mechanism of the device, and the reason for CIE change with increasing driving voltages. | | | 9. | Low dark current and internal gain mechanism of GaN MSM photodetectors fabricated on bulk GaN substrate Original Research Article Pages 39-42 Feng Xie, Hai Lu, Xiangqian Xiu, Dunjun Chen, Ping Han, Rong Zhang, Youdou Zheng
Research highlights► MSM UV photodetectors are fabricated on low-defect-density homoepitaxial GaN layer. ► The photodetector exhibits ultra-low dark current and high UV/visible rejection ratio. ► The internal gain is attributed to hole trapping at interface and image-force lowering effect. | | | 10. | Generic complex-variable potential equation for the undoped asymmetric independent double-gate MOSFET Original Research Article Pages 43-51 Adelmo Ortiz-Conde, Francisco J. García-Sánchez
Research highlights► Single completely generic equation of channel potential for undoped asymmetric independently driven double-gate MOSFETs. ► Channel potential equation is based on complex variables and is valid for all values of front and back-gate bias. ► The unified nature of the proposed equation provides a better basis for global physical insight. ► Several examples, including the all important fully symmetric case, are analyzed. | | | 11. | Compact modeling of CMOS transistors under variable uniaxial stress Original Research Article Pages 52-60 Nicoleta Wacker, Harald Richter, Mahadi-Ul Hassan, Horst Rempp, Joachim N. Burghartz
Research highlights► We propose a method to simulate the effect of uniaxial stress on MOSFETs. ► The method is valid for any drain current and stress directions in (001) Si plane. ► It can perform static and dynamic simulations, in linear and saturation regions. ► It is simulator-independent and does not depend on the source of uniaxial stress. ► It is adaptable to other bulk CMOS nodes and to other technologies such as SOI. | | | 13. | In-depth physical investigation of GeOI pMOSFET by TCAD calibrated simulation Original Research Article Pages 67-72 B. Grandchamp, M.-A. Jaud, P. Scheiblin, K. Romanjek, L. Hutin, C. Le Royer, M. Vinet
Research highlights► We performed 2D simulations of germanium-on-insulator fully-depleted pMOSFET. ► Interface traps, mobility and leakage were calibrated versus experimental data. ► The prediction of electrical characteristics is accurate for several gate lengths. ► These simulations help in finding guidelines for improving the on-state current. | | | 14. | n+-Doped-layer free amorphous silicon thin film solar cells fabricated with the CuMg alloy as back contact metal Original Research Article Pages 73-75 M.C. Wang, T.C. Chang, S.W. Tsao, Y.Z. Chen, S.C. Tseng, T.C. Hsu, D.J. Jan, C.F. Ai, J.R. Chen
Research highlights► The feasibility of n+-doped-layer free a-Si:H TFSC has been investigated. ► The ohmic-contact characteristic has been achieved by using the CuMg alloy. ► The proposed structure showed the typical solar cell I–V characteristic. ► The CuMg alloy was suitable for the replacement of n+-doped-layer. | | | 17. | Mobility in ultrathin SOI MOSFET and pseudo-MOSFET: Impact of the potential at both interfaces Pages 83-86 G. Hamaide, F. Allibert, F. Andrieu, K. Romanjek, S. Cristoloveanu
Research highlights► Biasing the back interface in accumulation while extracting carrier mobility in FD-SOI MOSFETs leads to underestimated values. ► Apparent mobility degradation with decreasing film thickness in ultra-thin SOI MOSFET or Pseudo-MOSFET measurement is due to an additional component of the vertical electric field. ► In Pseudo-MOSFET measurements, the additional component of the vertical electric field comes from the traps and charges at the free-surface of the sample. ► We propose a new model to take this additional component of the vertical electric field into account. | | |