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jueves, 26 de marzo de 2009

ScienceDirect Alert: Solid-State Electronics, Vol. 53, Iss. 4, 2009


ScienceDirect

New Volume/Issue is now available on ScienceDirect
Solid-State ElectronicsSolid-State Electronics

Volume 53, Issue 4,  Pages 401-468 (April 2009)

Special Issue with papers selected from the Ultimate Integration on Silicon Conference, ULIS 2008
Edited by Luca Selmi, David Esseni and Pierpaolo Palestri

 1. Editorial Board
Page IFC
 
  Editorial
 2. Foreword
Page 401
Luca Selmi, David Esseni, Pierpaolo Palestri
 
  Regular Papers
 3. Low-voltage scaling limitations for nano-scale CMOS LSIs
Pages 402-410
Kiyoo Itoh, Masashi Horiguchi
 
 4. Innovative devices for integrated circuits – A design perspective
Pages 411-417
D. Schmitt-Landsiedel, C. Werner
 
 5. Impact of variability on the performance of SOI Schottky barrier MOSFETs
Pages 418-423
S.F. Feste, M. Zhang, J. Knoch, S. Mantl
 
 6. Multi-Subband Monte Carlo simulations of ION degradation due to fin thickness fluctuations in FinFETs
Pages 424-432
N. Serra, P. Palestri, G.D.J. Smit, L. Selmi
 
 7. High frequency performance of sub-100 nm UTB-FDSOI featuring TiN/HfO2 gate stack
Pages 433-437
Tao Chuan Lim, Olivier Rozeau, Christel Buj, Michel Paccaud, Sylvie Lepilliet, Gilles Dambrine, François Danneville
 
 8. Determination of electron effective mass and electron affinity in HfO2 using MOS and MOSFET structures
Pages 438-444
S. Monaghan, P.K. Hurley, K. Cherkaoui, M.A. Negara, A. Schenk
 
 9. Simulation of self-heating effects in different SOI MOS architectures
Pages 445-451
M. Braccioli, G. Curatola, Y. Yang, E. Sangiorgi, C. Fiegna
 
 10. On the validity of the effective mass approximation and the Luttinger k.p model in fully depleted SOI MOSFETs
Pages 452-461
D. Rideau, M. Feraille, M. Michaillat, Y.M. Niquet, C. Tavernier, H. Jaouen
 
 11. Tight-binding and effective mass modeling of armchair graphene nanoribbon FETs
Pages 462-467
Roberto Grassi, Stefano Poli, Elena Gnani, Antonio Gnudi, Susanna Reggiani, Giorgio Baccarani
 


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