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jueves, 5 de marzo de 2009

ScienceDirect Alert: Solid-State Electronics, Vol. 53, Iss. 3, 2009


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Solid-State ElectronicsSolid-State Electronics

Volume 53, Issue 3,  Pages 251-400 (March 2009)


 1. Editorial Board
Page IFC
 
  Regular Papers
 2. The charge transport mechanism in silicon nitride: Multi-phonon trap ionization
Pages 251-255
A.V. Vishnyakov, Yu.N. Novikov, V.A. Gritsenko, K.A. Nasyrov
 
 3. Unified analytical threshold voltage model for non-uniformly doped dual metal gate fully depleted silicon-on-insulator MOSFETs
Pages 256-265
Rathnamala Rao, Guruprasad Katti, Dnyanesh S. Havaldar, Nandita DasGupta, Amitava DasGupta
 
 4. A flexible organic thin-film transistor with 6,13-bis(triisopropylsilylethynyl)pentacene and a methyl-siloxane-based dielectric
Pages 266-270
Jae-Hong Kwon, Sang-Il Shin, Jinnil Choi, Myung-Ho Chung, Hochul Kang, Byeong-Kwon Ju
 
 5. Wave function penetration effects on ballistic drain current in double gate MOSFETs fabricated on (1 0 0) and (1 1 0) silicon surfaces
Pages 271-275
Md. Khalid Ashraf, Asif Islam Khan, Anisul Haque
 
 6. Phase change memory cell based on Sb2Te3/TiN/Ge2Sb2Te5 sandwich-structure
Pages 276-278
Feng Rao, Zhitang Song, Liangcai Wu, Yuefeng Gong, Songlin Feng, Bomy Chen
 
 7. Charge trapping behavior of SiO2-Anodic Al2O3–SiO2 gate dielectrics for nonvolatile memory applications
Pages 279-284
Chun-Hsien Huang, En-Jui Li, Wai-Jyh Chang, Na-Fu Wang, Chen-I Hung, Mau-Phon Houng
 
 8. A comprehensive model of frequency dispersion in 4H–SiC MESFET
Pages 285-291
Hongliang Lu, Yimen Zhang, Yuming Zhang, Tao Zhang
 
 9. Gated tunnel diode in oscillator applications with high frequency tuning
Pages 292-296
L.-E. Wernersson, M. Ärlelid, M. Egard, E. Lind
 
 10. Analytical modeling and numerical simulations of the thermal behavior of trench-isolated bipolar transistors
Pages 297-307
I. Marano, V. d’Alessandro, N. Rinaldi
 
 11. Performance evaluation of sphere-form cathodes in the fabrication of optoelectronic In2O3SnO2 PET
Pages 308-313
P.S. Pa
 
 12. Measurement of the MOSFET drain current variation under high gate voltage
Pages 314-319
Kazuo Terada, Tetsuo Chagawa, Jianyu Xiang, Katsuhiro Tsuji, Takaaki Tsunomura, Akio Nishida
 
 13. Visualization of local gate control in a ZnO inter-nanowire junction device
Pages 320-323
Jin-Hyung Lim, Hyun Jin Ji, Goo-Eun Jung, Kyung Hoon Chung, Gyu-Tae Kim, Jeong Sook Ha, Ji-Yong Park, Se-Jong Kahng
 
 14. Negative capacitance in light-emitting devices
Pages 324-328
C.Y. Zhu, L.F. Feng, C.D. Wang, H.X. Cong, G.Y. Zhang, Z.J. Yang, Z.Z. Chen
 
 15. Zinc tin oxide based driver for highly transparent active matrix OLED displays
Pages 329-331
Patrick Görrn, Fatemeh Ghaffari, Thomas Riedl, Wolfgang Kowalsky
 
 16. An internally-matched GaN HEMTs device with 45.2 W at 8 GHz for X-band application
Pages 332-335
X.L. Wang, T.S. Chen, H.L. Xiao, J. Tang, J.X. Ran, M.L. Zhang, C. Feng, Q.F. Hou, M. Wei, L.J. Jiang, J.M. Li, Z.G. Wang
 
 17. Optical properties studies in InGaN/GaN multiple-quantum well
Pages 336-340
Lihong Zhu, Baolin Liu
 
 18. Temperature dependent analytical model for current–voltage characteristics of AlGaN/GaN power HEMT
Pages 341-348
M.A. Huque, S.A. Eliza, T. Rahman, H.F. Huq, S.K. Islam
 
 19. Discussions and extension of van Vliet’s noise model for high speed bipolar transistors
Pages 349-354
Kejun Xia, Guofu Niu
 
 20. Effects of nitrogen incorporation into lanthana film by plasma immersion ion implantation
Pages 355-358
Banani Sen, Hei Wong, B.L. Yang, P.K. Chu, K. Kakushima, H. Iwai
 
 21. Experimental characterization of the subthreshold leakage current in triple-gate FinFETs
Pages 359-363
A. Tsormpatzoglou, C.A. Dimitriadis, M. Mouis, G. Ghibaudo, N. Collaert
 
 22. Simulation of hole and electron tunnel currents in MIS devices adopting the symmetric Franz-type dispersion relation for the charged carriers in thin insulators
Pages 364-370
M.I. Vexler, A. Kuligk, B. Meinerzhagen
 
 23. Formation of polycrystalline-Si thin-film-transistors with a retrograde channel doping profile
Pages 371-375
Miin-Horng Juang, S.-H. Cheng, S.-L. Jang
 
 24. A nonparabolicity model compared to tight-binding: The case of square silicon quantum wires
Pages 376-382
A. Esposito, M. Luisier, M. Frey, A. Schenk
 
 25. Design and numerical analysis of a polarization-insensitive quantum well optoelectronic integrated amplifier-switch
Pages 383-388
E. Darabi, V. Ahmadi
 
 26. Unified random access memory (URAM) by integration of a nanocrystal floating gate for nonvolatile memory and a partially depleted floating body for capacitorless 1T-DRAM
Pages 389-391
Seong-Wan Ryu, Jin-Woo Han, Chung-Jin Kim, Sungho Kim, Yang-Kyu Choi
 
 27. Piezoresistance effect of strained and unstrained fully-depleted silicon-on-insulator MOSFETs integrating a HfO2/TiN gate stack
Pages 392-396
F. Rochette, M. Cassé, M. Mouis, A. Haziot, T. Pioger, G. Ghibaudo, F. Boulanger
 
  Short Communication
 28. Pure red organic light-emitting diode based on a europium complex
Pages 397-399
Qin Xue, Ping Chen, Jianhua Lu, Guohua Xie, Jingying Hou, Shiyong Liu, Yi Zhao, Liying Zhang, Bin Li
 


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