| 3. | Channel width dependence of hot electron injection program/hot hole erase cycling behavior in silicon-oxide-nitride-oxide-silicon (SONOS) memories Pages 844-848 Seung-Hwan Seo, Se-Woon Kim, Jang-Uk Lee, Gu-Cheol Kang, Kang-Seob Roh, Kwan-Young Kim, Soon-Young Lee, Chang-Min Choi, Kwan-Jae Song, So-Ra Park, Jun-Hyun Park, Ki-Chan Jeon, Dong Myong Kim, Dae Hwan Kim, Hyungcheol Shin, Jong Duk Lee and Byung-Gook Park | | | 12. | Small-signal performance and modeling of sub-50 nm nMOSFETs with fT above 460-GHz Pages 899-908 V. Dimitrov, J.B. Heng, K. Timp, O. Dimauro, R. Chan, M. Hafez, J. Feng, T. Sorsch, W. Mansfield, J. Miner, A. Kornblit, F. Klemens, J. Bower, R. Cirelli, E.J. Ferry, A. Taylor, M. Feng and G. Timp | | |