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For more information about iPeerReview, go to http://labs.aip.org/. | Top DownloadsView the 20 most downloaded articles published in Applied Physics Letters, updated monthly. Image from Single-electron shuttle based on a silicon quantum dot |
Research Highlights
Sb-rich Si-Sb-Te phase change material for multilevel data storage: The degree of disorder in the crystalline state
Xilin Zhou, Liangcai Wu, Zhitang Song, Feng Rao, Yan Cheng, Cheng Peng, Dongning Yao, Sannian Song, Bo Liu, Songlin Feng, and Bomy Chen
The phase change memory with monolayer chalcogenide film
Appl. Phys. Lett. 99, 032105 (2011)
Electrical spin accumulation with improved bias voltage dependence in a crystalline CoFe/MgO/Si system
Kun-Rok Jeon, Byoung-Chul Min, Il-Jae Shin, Chang-Yup Park, Hun-Sung Lee, Young-Hun Jo, and Sung-Chul Shin
Here the achievement of electrical spin accumulation in n-type Si using a crystalline CoFe/MgO tunnel contact is reported. The spin signal and lifetime obtained in this system show consistent behavior with the temperature variation irrespective of the bias voltage. Notably, the spin signal exhibits nearly symmetric dependence with respect to the bias polarity.
Appl. Phys. Lett. 98, 262102 (2011)
Improved endurance of resistive switching TiO2 thin film by hourglass shaped Magnéli filaments
Gun Hwan Kim, Jong Ho Lee, Jun Yeong Seok, Seul Ji Song, Jung Ho Yoon, Kyung Jean Yoon, Min Hwan Lee, Kyung Min Kim, Hyung Dong Lee, Seung Wook Ryu, Tae Joo Park, and Cheol Seong Hwang
A modified biasing scheme was adopted to improve the electrical endurance characteristics of conducting filamentary resistive switching (RS) in a Pt/TiO2/Pt RS cell. The modified bias scheme included the application of bias voltages with alternating polarity, even though RS proceeds in non-polar mode, which results in the stable distribution of each resistance states as well as improved endurance. This was attributed to the minimized consumption of oxygen ions in the TiO2 film, which can be induced by the formation of hourglass-shaped conducting filament (HSCF). The presence of a HSCF was confirmed by high-resolution transmission electron microscopy.
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